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Disambiguation of "Desineni, Rao"

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Defect Modeling Using Fault Tuples.

, , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (11): 2450-2464 (2006)

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Bharathi Vasudeva Rao

Yadlapalli Venkateswara Rao

Balakrishna Rao

Sonti Venkata Suryanarayana Rao

Nidamboor Vasanth Rao

 

Other publications of authors with the same name

Hard to find, easy to find systematics; just find them., , , and . ITC, page 388-397. IEEE Computer Society, (2010)Defect Modeling Using Fault Tuples., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (11): 2450-2464 (2006)Universal test generation using fault tuples., , and . ITC, page 812-819. IEEE Computer Society, (2000)Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations., , , , , , , , , and 3 other author(s). ITC, page 508-517. IEEE Computer Society, (2004)Fault Tuples in Diagnosis of Deep-Submicron Circuits., , , , , and . ITC, page 233-241. IEEE Computer Society, (2002)Deriving Feature Fail Rate from Silicon Volume Diagnostics Data., , , , , and . IEEE Des. Test, 30 (4): 26-34 (2013)Pylon: Towards an integrated customizable volume diagnosis infrastructure., , , , , , and . ITC, page 1-9. IEEE, (2016)Multiple-detect ATPG based on physical neighborhoods., , , and . DAC, page 1099-1102. ACM, (2006)Extraction of defect density and size distributions from wafer sort test results., , , , , , and . DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior., , and . ITC, page 1-10. IEEE Computer Society, (2006)