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Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device., , , and . APCCAS, page 1147-1150. IEEE, (2010)HEALED: HEaling & Attestation for Low-End Embedded Devices., , and . Financial Cryptography, volume 11598 of Lecture Notes in Computer Science, page 627-645. Springer, (2019)Characterization of parasitic residual deposition on passivation layer in electroless nickel immersion gold process., , and . Microelectron. Reliab., 47 (7): 1120-1126 (2007)Automated Prediction of the QoS of Service Orchestrations: PASO at Work., , and . ESOCC Workshops, volume 567 of Communications in Computer and Information Science, page 111-125. Springer, (2015)DIAT: Data Integrity Attestation for Resilient Collaboration of Autonomous Systems., , , , , and . NDSS, The Internet Society, (2019)Role of Annotation in Electronic Process Guide (EPG)., and . FGCN (2), page 569-572. IEEE Computer Society, (2007)The surface characteristics of under bump metallurgy (UBM) in electroless nickel immersion gold (ENIG) deposition., , , and . Microelectron. Reliab., 46 (2-4): 367-379 (2006)A practical investigation on nickel plated copper heat spreader with different catalytic activation processes for flip-chip ball grid array packages., , , , and . Microelectron. Reliab., 49 (5): 537-543 (2009)Selection of High Strength Encapsulant for MEMS Devices Undergoing High Pressure Packaging, , , and . CoRR, (2008)A Survey on Human Cancer Categorization Based on Deep Learning., , , and . Frontiers Artif. Intell., (2022)