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Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives.

, , and . ETS, page 55-62. IEEE Computer Society, (2007)

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Block-level bayesian diagnosis of analogue electronic circuits., , , and . DATE, page 1767-1772. IEEE Computer Society, (2010)Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm., , and . DDECS, page 287-292. IEEE Computer Society, (2008)A computational model of the effects of macronutrients absorption and physical exercise on hormonal regulation and metabolic homeostasis., , , , , and . Comput. Biol. Medicine, (September 2023)Re-configuration of sub-blocks for effective application of time domain tests., , and . DATE, page 707-712. EDA Consortium, San Jose, CA, USA, (2007)Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives., , and . ETS, page 55-62. IEEE Computer Society, (2007)A robust metric for screening outliers from analogue product manufacturing tests responses., and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)Multivariate model for test response analysis., and . European Test Symposium, page 250. IEEE Computer Society, (2010)A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses., and . ETS, page 159-164. IEEE Computer Society, (2011)Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses., and . IEEE Des. Test, 30 (3): 18-24 (2013)