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Modeling Time Domain Magnetic Emissions of ICs.

, , , , , and . PATMOS, volume 6448 of Lecture Notes in Computer Science, page 238-249. Springer, (2010)

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Modeling Time Domain Magnetic Emissions of ICs., , , , , and . PATMOS, volume 6448 of Lecture Notes in Computer Science, page 238-249. Springer, (2010)Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation., , , , , , and . IRPS, page 1. IEEE, (2015)Electrical modeling of the effect of beam profile for pulsed laser fault injection., , , and . Microelectron. Reliab., 49 (9-11): 1143-1147 (2009)Methodology for Dynamic Power Verification of Contactless Smartcards., , and . PATMOS, volume 4148 of Lecture Notes in Computer Science, page 280-291. Springer, (2006)Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents., , , , , and . IOLTS, page 150-155. IEEE, (2015)Electromagnetic Fault Injection : How Faults Occur., , and . FDTC, page 9-16. IEEE, (2019)Laser-induced fault effects in security-dedicated circuits., , , , , , , , , and 9 other author(s). VLSI-SoC, page 1-6. IEEE, (2014)Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits., , , , and . PATMOS, volume 5349 of Lecture Notes in Computer Science, page 229-236. Springer, (2008)Voltage Spikes on the Substrate to Obtain Timing Faults., , , , and . DSD, page 483-486. IEEE Computer Society, (2013)Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell., , , , and . Microelectron. Reliab., 53 (9-11): 1300-1305 (2013)