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Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes., , , , , , and . European Test Symposium, page 132-137. IEEE Computer Society, (2010)Detecting NBTI induced failures in SRAM core-cells., , , , , , and . VTS, page 75-80. IEEE Computer Society, (2010)Setting test conditions for improving SRAM reliability., , , , , , and . European Test Symposium, page 257. IEEE Computer Society, (2010)Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes., , , , , , and . J. Electron. Test., 28 (3): 317-329 (2012)On using address scrambling to implement defect tolerance in SRAMs., , , , , , and . ITC, page 1-8. IEEE Computer Society, (2011)A statistical simulation method for reliability analysis of SRAM core-cells., , , , , , and . DAC, page 853-856. ACM, (2010)Impact of Resistive-Bridging Defects in SRAM Core-Cell., , , , , , and . DELTA, page 265-269. IEEE Computer Society, (2010)