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Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.

, , and . IET Comput. Digit. Tech., 4 (4): 317-324 (2010)

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Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction.. J. Electron. Test., 29 (5): 625-634 (2013)Reduction of Power Dissipation during Scan Testing by Test Vector Ordering., and . MTV, page 15-21. IEEE Computer Society, (2007)Two-Way Multicasting for Test Data Compression., , and . MTV, page 60-64. IEEE Computer Society, (2012)A Multi-dimensional Pattern Run-Length Method for Test Data Compression., , , and . Asian Test Symposium, page 325-330. IEEE Computer Society, (2009)Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing., , , and . Asian Test Symposium, page 111-116. IEEE Computer Society, (2009)$2^n$ Pattern Run-Length for Test Data Compression., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (4): 644-648 (2012)Power Reduction during Scan Testing Based on Multiple Capture Technique., , and . IEICE Trans. Electron., 91-C (5): 798-805 (2008)Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction., , and . IET Comput. Digit. Tech., 4 (4): 317-324 (2010)Test Data Compression Using Multi-dimensional Pattern Run-length Codes., and . J. Electron. Test., 26 (3): 393-400 (2010)Deterministic ATPG for Low Capture Power Testing., , and . MTV, page 24-29. IEEE Computer Society, (2012)