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Impact of resistive-open defects on the heat current of TAS-MRAM architectures., , , , , , , , and . DATE, page 532-537. IEEE, (2012)Practical Experiments to Evaluate Quality Metrics of MRAM-Based Physical Unclonable Functions., , , , , and . IEEE Access, (2020)Coupling-based resistive-open defects in TAS-MRAM architectures., , , , , , , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Scalability and logic functionalities of TA-MRAMs., , , , , , , , , and 1 other author(s). NEWCAS, page 1-4. IEEE, (2013)Practical Experiments on Fabricated TAS-MRAM Dies to Evaluate the Stochastic Behavior of Voltage-Controlled TRNGs., , , and . IEEE Access, (2019)Automated characterization of TAS-MRAM test arrays., , , , , , and . DTIS, page 1-2. IEEE, (2015)Impact of Resistive-Bridge Defects in TAS-MRAM Architectures., , , , , , , , and . Asian Test Symposium, page 125-130. IEEE Computer Society, (2012)Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions., , , , and . NVMTS, page 1-4. IEEE, (2015)Breakdown mechanisms in MgO based magnetic tunnel junctions and correlation with low frequency noise., , , , , and . Microelectron. Reliab., 53 (9-11): 1239-1242 (2013)A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs., , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (11): 2326-2335 (2014)