Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Tester-based optical and electrical diagnostic system and techniques., and . VTS, page 209-214. IEEE Computer Society, (2012)Estimating Urban Evapotranspiration at 10m Resolution Using Vegetation Information from Sentinel-2: A Case Study for the Beijing Sponge City., and . Remote. Sens., 13 (11): 2048 (2021)Mapping of Oriental Migratory Locust Habitat Using Landsat OLI Images in Dongying City, China., , , , , and . Agro-Geoinformatics, page 1-5. IEEE, (2018)Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor., , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 57-I (8): 1838-1847 (2010)Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1663-1668 (2003)Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE)., , , , , , and . Microelectron. Reliab., 45 (9-11): 1550-1553 (2005)Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking., , , , , , , , , and 25 other author(s). CoRR, (2020)Latchup Analysis Using Emission Microscopy., , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation., , , , , and . ESSDERC, page 293-296. IEEE, (2022)On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)., , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)