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An Efficient Partitioning Strategy for Pseudo-Exhaustive Testing.

, , and . DAC, page 242-248. ACM Press, (1993)

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Scan Path with Look Ahead Shifting (SPLASH)., and . ITC, page 696-704. IEEE Computer Society, (1986)On Area and Yield Considerations for Fault-Tolerant VLSI Processor Arrays., and . IEEE Trans. Computers, 33 (1): 21-27 (1984)Test Schedules for VLSI Circuits Having Built-In Test Hardware., and . IEEE Trans. Computers, 35 (4): 361-367 (1986)Roving Emulation as a Fault Detection Mechanism., and . IEEE Trans. Computers, 35 (11): 933-939 (1986)Procedures for Eliminating Static and Dynamic Hazards in Test Generation., and . IEEE Trans. Computers, 23 (10): 1069-1078 (1974)A Note on Three-Valued Logic Simulation.. IEEE Trans. Computers, 21 (4): 399-402 (1972)Functional Partitioning and Simulation of Digital Circuits.. IEEE Trans. Computers, 19 (11): 1038-1046 (1970)Recent Developments in Design Automation.. Computer, 5 (3): 23-35 (1972)Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (5): 754-764 (2012)Bounds on pseudoexhaustive test lengths., , and . IEEE Trans. Very Large Scale Integr. Syst., 6 (3): 420-431 (1998)