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Evaluation of Entropy Driven Compression Bounds on Industrial Designs.

, , , , and . ATS, page 13-18. IEEE Computer Society, (2008)

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Design for Testability in Nanometer Technologies; Searching for Quality., and . ISQED, page 167-172. IEEE Computer Society, (2000)Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization., , , and . VLSI Design, page 364-369. IEEE Computer Society, (2011)Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme., , , , , , and . ITC, page 407-416. IEEE Computer Society, (2002)CTL the language for describing core-based test., , , , , and . ITC, page 131-139. IEEE Computer Society, (2001)Unifying scan compression., , , , , , , and . DFT, page 191-196. IEEE Computer Society, (2014)Test the test experts: do we know what we are doing?. ITC, page 1. IEEE, (2005)Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set., , , and . ITC, page 1-7. IEEE, (2017)Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors., , and . ITC, page 1-7. IEEE, (2016)Enhancing test efficiency for delay fault testing using multiple-clocked schemes., , , , , , and . DAC, page 371-374. ACM, (2002)A New Logic Encryption Strategy Ensuring Key Interdependency., , , , and . VLSI Design, page 429-434. IEEE Computer Society, (2017)