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Correlation method of circuit-performance and technology fluctuations for improved design reliability., , , , , , , , , and . ASP-DAC, page 39-44. ACM, (2001)A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits., , , , , , , , and . IEICE Trans. Electron., 94-C (4): 495-503 (2011)Asymptotic waveform evaluation for transient analysis of 3-D interconnect structures., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (7): 988-996 (1993)Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress., , , , , and . IEICE Trans. Electron., 91-C (7): 1142-1150 (2008)Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability., , , , , , , , and . CICC, page 357-360. IEEE, (2001)A predictable compact model for non-monotonous Vth-Pelgrom plot of long channel halo-implanted transistors.. ISQED, page 391-397. IEEE, (2013)Non-quasi-static approach with surface-potential-based MOSFET model HiSIM for RF circuit simulations., , , , , , , , , and 2 other author(s). Math. Comput. Simul., 79 (4): 1096-1106 (2008)Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design., , , , , , , , , and . ASP-DAC, page 179-183. ACM, (2003)Accurate analysis of substrate sensitivity of active transistors in an analog circuit., , , , , , , , and . ISQED, page 56-61. IEEE, (2011)MOSFET harmonic distortion analysis up to the non-quasi-static frequency regime., , , , , , , , , and . CICC, page 827-830. IEEE, (2005)