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Disambiguation of "Landis, David L."

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Hazard driven test generation for SMT processors.

, , and . DATE, page 256-259. IEEE, (2012)

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David L Dowdey

David L Weakliem

David L Largent

Elisabeth Landis

Susanne Landis

 

Other publications of authors with the same name

Using RASSP Modules in a Rapid System Prototyping Class.. MSE, page 53-54. IEEE Computer Society, (1999)Short Courses in System-on-a-Chip (SoC) Design., , , , , , and . MSE, page 126-127. IEEE Computer Society, (2003)A Self-Test System Architecture for Reconfigurable WSI.. ITC, page 275-282. IEEE Computer Society, (1989)Influence of Built-In Self Test on the Performance of Fault Tolerant VLSI Multiprocessors., , and . ICPP, page 114-116. Pennsylvania State University Press, (1987)Partitioning algorithm to enhance VLSI testability., , and . ACM Southeast Regional Conference, page 121-129. ACM, (1998)Hazard driven test generation for SMT processors., , and . DATE, page 256-259. IEEE, (2012)Applications of the IEEE P1149.5 Module Test and Maintenance Bus., , and . ITC, page 984-992. IEEE Computer Society, (1992)Partitioning sequential circuits for pseudoexhaustive testing., , and . IEEE Trans. Very Large Scale Integr. Syst., 8 (5): 534-541 (2000)A test methodology for wafer scale system.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (1): 76-82 (1992)Microelectronics Education As Workforce Development., and . MSE, page 37-38. IEEE Computer Society, (2003)