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Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout., , and . Microelectron. Reliab., 45 (9-11): 1487-1492 (2005)Editorial.. Microelectron. Reliab., 54 (9-10): 1637 (2014)Technologies for Heterogeneous Integration - Challenges and chances for fault isolation.. Microelectron. Reliab., (2017)Ultra sensitive measurement of dielectric current under pulsed stress conditions., , , and . Microelectron. Reliab., 55 (11): 2254-2257 (2015)Optical interaction in active analog circuit elements., , and . Microelectron. Reliab., (2017)Backside E-Beam Probing on Nano scale devices., , , , , , , , and . ITC, page 1-9. IEEE Computer Society, (2007)New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis., , , , , , , , , and 1 other author(s). IRPS, page 1-9. IEEE, (2019)Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing., , , , , and . Microelectron. Reliab., 49 (9-11): 1158-1164 (2009)Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning., , and . Microelectron. Reliab., 51 (9-11): 1632-1636 (2011)IC security and quality improvement by protection of chip backside against hardware attacks., , , , , , and . Microelectron. Reliab., (2018)