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Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop.

, , and . VLSI Design, (2008)

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Concepção de Circuitos e Sistemas Integrados., , and . RITA, 8 (1): 7-21 (2001)Built-in Test of Analog Non-Linear Circuits in a SOC Environment., , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 437-448. Kluwer, (2001)Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?. DFT, page 224-224. IEEE Computer Society, (2009)An Approach to the Built-In Self-Test of Field Programmable Analog Arrays., , , , and . VTS, page 383-388. IEEE Computer Society, (2004)A broad strategy to detect crosstalk faults in network-on-chip interconnects., , , , and . VLSI-SoC, page 298-303. IEEE, (2010)Testing the Configurable Analog Blocks of Field Programmable Analog Arrays., , , , and . ITC, page 893-902. IEEE Computer Society, (2004)Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture, , , and . CoRR, (2007)Bridging the Gap between Microelectronics and Micromechanics Testing.. Asian Test Symposium, page 513. IEEE Computer Society, (1998)Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation., , , and . ISVLSI, page 192-197. IEEE Computer Society, (2007)A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester., , and . DATE, page 184-188. IEEE Computer Society / ACM, (1999)