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Improving the Testability of VLSI Circuits through Partitioning., and . ISCAS, page 199-202. IEEE, (1994)Defining a Standard for Fault Simulator Evaluation., and . ITC, page 1001. IEEE Computer Society, (1988)Fault Simulation and Test Generation by Fault Sampling Techniques., and . ICCD, page 365-368. IEEE Computer Society, (1992)Three approaches to design fault tolerant programmable logic arrays., and . ACM Southeast Regional Conference, page 151-158. ACM, (1990)Self-testing and self-reconfiguration architecture for 2-D WSI arrays., and . SPDP, page 527-530. IEEE Computer Society, (1990)Pseudo-Exhaustive Testing of Sequential Circuits., , and . Great Lakes Symposium on VLSI, page 109-. IEEE Computer Society, (1999)Design and Test in the Universities.. ITC, page 245-245. IEEE Computer Society, (1989)A Method for Consistent Fault Coverage Reporting., , and . IEEE Des. Test Comput., 10 (3): 68-79 (1993)Partitioning sequential circuits for pseudoexhaustive testing., , and . IEEE Trans. Very Large Scale Integr. Syst., 8 (5): 534-541 (2000)Partitioning algorithm to enhance VLSI testability., , and . ACM Southeast Regional Conference, page 121-129. ACM, (1998)