Author of the publication

An energy harvesting wireless sensor node for IoT systems featuring a near-threshold voltage IA-32 microcontroller in 14nm tri-gate CMOS.

, , , , , , , , , , , and . VLSI Circuits, page 1-2. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Monolithic voltage conversion in low-voltage CMOS technologies., , , and . Microelectron. J., 36 (9): 863-867 (2005)Enhanced Power and Electromagnetic SCA Resistance of Encryption Engines via a Security-Aware Integrated All-Digital LDO., , , , , , and . IEEE J. Solid State Circuits, 55 (2): 478-493 (2020)A 0.45-1 V Fully-Integrated Distributed Switched Capacitor DC-DC Converter With High Density MIM Capacitor in 22 nm Tri-Gate CMOS., , , , , , and . IEEE J. Solid State Circuits, 49 (4): 917-927 (2014)A 340 mV-to-0.9 V 20.2 Tb/s Source-Synchronous Hybrid Packet/Circuit-Switched 16 × 16 Network-on-Chip in 22 nm Tri-Gate CMOS., , , , , , , , , and . IEEE J. Solid State Circuits, 50 (1): 59-67 (2015)A Light-Load Efficient Fully Integrated Voltage Regulator in 14-nm CMOS With 2.5-nH Package-Embedded Air-Core Inductors., , , , , , , , , and 3 other author(s). IEEE J. Solid State Circuits, 54 (12): 3316-3325 (2019)A 100-Gbps Fault-Injection Attack-Resistant AES-256 Engine With 99.1%-99.99% Error Coverage in Intel 4 CMOS., , , , , and . IEEE J. Solid State Circuits, 59 (1): 79-89 (January 2024)Reducing the data switching activity of serialized datastreams., , , and . ISCAS, IEEE, (2006)Wide-Range Many-Core SoC Design in Scaled CMOS: Challenges and Opportunities., , , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (5): 843-856 (2021)Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache., , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 10 (2): 91-95 (2002)Intrinsic MOSFET parameter fluctuations due to random dopant placement., , and . IEEE Trans. Very Large Scale Integr. Syst., 5 (4): 369-376 (1997)