( en | de | ru )

 

Disambiguation of "Kundu, Sandip"

Author of the publication

copydeleteadd this publication to your clipboard
Lithography Constrained Placement and Post-Placement Layout Optimization for Manufacturability.

, , and . ISVLSI, page 200-205. IEEE Computer Society, (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sandip Agarwala

Arijit Kundu

Sandip Murarka

Sandip Roy

Shankhamala Kundu

 

Other publications of authors with the same name

A system-level solution for managing spatial temperature gradients in thinned 3D ICs., , , and . ISQED, page 88-95. IEEE, (2013)A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays., , and . IEEE Trans. Computers, 61 (7): 986-998 (2012)Symbolic implication in test generation., , , and . EURO-DAC, page 492-496. EEE Computer Society, (1991)Preventing integrated circuit piracy via custom encoding of hardware instruction set., , and . ISQED, page 234-241. IEEE, (2016)Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Nanotechnology Joint Special Section on Defect and Fault Tolerance in VLSI and Nanotechnology Systems., , and . IEEE Trans. Computers, 65 (3): 677-678 (2016)Defeating Strong PUF Modeling Attack via Adverse Selection of Challenge-Response Pairs., , , and . AsianHOST, page 25-30. IEEE, (2018)On linewidth-based yield analysis for nanometer lithography., and . DATE, page 381-386. IEEE, (2009)A study on placement of post silicon clock tuning buffers for mitigating impact of process variation., and . DATE, page 292-295. IEEE, (2009)Peer pressure on identity: On requirements for disambiguating PUFs in noisy environment., , and . NATW, page 1-4. IEEE, (2017)A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits., , and . ACM Great Lakes Symposium on VLSI, page 529-534. ACM, (2009)