Author of the publication

A Parallel Pattern Mixed-Level Fault Simulator.

, , , and . DAC, page 716-719. IEEE Computer Society Press, (1990)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A Compiled-Code Parallel Pattern Logic Simulator With Inertial Delay Model., , and . J. Inf. Sci. Eng., 15 (6): 885-897 (1999)Flip-Flop Selection for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits., and . J. Inf. Sci. Eng., 16 (5): 687-702 (2000)A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus., , , and . IEEE Trans. Very Large Scale Integr. Syst., 17 (2): 306-311 (2009)Identifying invalid states for sequential circuit test generation., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 16 (9): 1025-1033 (1997)Modeling and testing of interference faults in the nano NAND Flash memory., , and . DATE, page 527-531. IEEE, (2012)Multilevel full-chip routing with testability and yield enhancement., , , , and . SLIP, page 29-36. ACM, (2005)An On-Chip Jitter Measurement Circuit for the PLL., and . Asian Test Symposium, page 332-335. IEEE Computer Society, (2003)Finite State Machine Synthesis for At-Speed Oscillation Testability., , , , and . Asian Test Symposium, page 360-365. IEEE Computer Society, (2005)A New BIST Scheme Based on a Summing-into-Timing-Signal Principle with Self Calibration for the DAC., , and . Asian Test Symposium, page 58-61. IEEE Computer Society, (2004)All Digital Built-in Delay and Crosstalk Measurement for On-Chip Buses., , , , and . DATE, page 527-531. IEEE Computer Society / ACM, (2000)