( en | de | ru )

 

Disambiguation of "Rouzeyre, Bruno"

Author of the publication

copydeleteadd this publication to your clipboard
Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains.

, , and . DELTA, page 295-300. IEEE Computer Society, (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Armin Bruno

Axel Brunold

Horst Bruno

Horst Bruno

Eugen Bruno

 

Other publications of authors with the same name

SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Operators allocation in the silicon compiler SCOOP., , and . Integr., 8 (2): 99-109 (1989)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)A New Secure Stream Cipher for Scan Chain Encryption., , , , , and . IVSW, page 68-73. IEEE, (2018)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)Alleviating DFT Cost Using Testability Driven HLS., , and . Asian Test Symposium, page 46-51. IEEE Computer Society, (1998)A Heuristic for Test Scheduling at System Level., , and . DATE, page 1124. IEEE Computer Society, (2002)