( en | de | ru )

 

Disambiguation of "Storey, Thomas M."

Author of the publication

copydeleteadd this publication to your clipboard
Deformations of IC Structure in Test and Yield Learning.

, , , , , and . ITC, page 856-865. IEEE Computer Society, (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kier Storey

Andrew Storey

Joseph Storey Rippier

Thomas M Klapötke

Thomas M Zollner

 

Other publications of authors with the same name

Stuck Fault and Current Testing Comparison Using CMOS Chip Test., , , and . ITC, page 311-318. IEEE Computer Society, (1991)A Test Methodology to Support an ASEM MCM Foundry., , , and . ITC, page 426-435. IEEE Computer Society, (1994)A Test Methodology for VLSI Chips on Silicon.. ITC, page 359-368. IEEE Computer Society, (1993)CMOS Bridging Fault Detection., and . ITC, page 1123-1132. IEEE Computer Society, (1990)Testing in a high volume DSM Environment.. ITC, page 1422. IEEE Computer Society, (2004)A Test Methodology for High Performance MCMs., and . J. Electron. Test., 10 (1-2): 109-118 (1997)Delay test simulation., and . DAC, page 492-494. ACM, (1977)Deformations of IC Structure in Test and Yield Learning., , , , , and . ITC, page 856-865. IEEE Computer Society, (2003)