BibSonomy publications for /author/Rubin

BibSonomy publications for /author/RubinBibSonomypublrss/author/RubinBibSonomy RSS feed for /author/Rubin2012-02-15T13:13:03+01:00Assessing Model-Driven Software Product Lines for Lean and Agile Development: An Experience Report.http://www.bibsonomy.org/bibtex/2f87ddfe62d4195c8aa23c942416e5944/dblpdblp2012-02-14T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Jääskeläinen">Antti Jääskeläinen</a>, <a href="/author/Katara">Mika Katara</a>, <a href="/author/Rubin">Julia Rubin</a>, <a href="/author/Yatzkar-Haham">Tali Yatzkar-Haham</a>, and <a href="/author/Keren">Mila Keren</a> </span><em>SPLC Workshops, </em><em>page 171-180. </em><em>Lancaster University, </em>(<em>2010</em>)Implementing Code-Level Product Lines by Utilizing Generic Variability Services.http://www.bibsonomy.org/bibtex/20e763c841f4c2ecdc215eca22ce9dcb3/dblpdblp2012-02-14T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Maman">Itay Maman</a>, <a href="/author/Amarilio">Tomer Amarilio</a>, <a href="/author/Dotan">Dolev Dotan</a>, <a href="/author/Kirshin">Andrei Kirshin</a>, <a href="/author/Rubin">Julia Rubin</a>, and <a href="/author/Yatzkar-Haham">Tali Yatzkar-Haham</a> </span><em>SPLC Workshops, </em><em>page 298. </em><em>Lancaster University, </em>(<em>2010</em>)From Products to Product Lines Using Model Matching and Refactoring.http://www.bibsonomy.org/bibtex/29bf26e8b5e094126f8bd02f8a8dc2067/dblpdblp2012-02-14T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Rubin">Julia Rubin</a>, and <a href="/author/Chechik">Marsha Chechik</a> </span><em>SPLC Workshops, </em><em>page 155-162. </em><em>Lancaster University, </em>(<em>2010</em>)Promoting serendipity online: recommendations for tool design.http://www.bibsonomy.org/bibtex/28108a20300c60c59e3961850b87deb30/dblpdblp2012-02-09T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Burkell">Jacquelyn Burkell</a>, <a href="/author/Quan-Haase">Anabel Quan-Haase</a>, and <a href="/author/Rubin">Victoria L. Rubin</a> </span><em>iConference, </em><em>page 525-526. </em><em>ACM, </em>(<em>2012</em>)Multi-lingual information access tools: user survey.http://www.bibsonomy.org/bibtex/2351697a64f7db9d1faf7341958f93152/dblpdblp2012-02-09T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Nzomo">Peggy Nzomo</a>, <a href="/author/Rubin">Victoria L. Rubin</a>, and <a href="/author/Ajiferuke">Isola Ajiferuke</a> </span><em>iConference, </em><em>page 530-532. </em><em>ACM, </em>(<em>2012</em>)Interaction of Canard and Singular Hopf Mechanisms in a Neural Model.http://www.bibsonomy.org/bibtex/22347b47c349f2ad477b3e811d3e9fdc2/dblpdblp2012-02-08T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Curtu">Rodica Curtu</a>, and <a href="/author/Rubin">Jonathan Rubin</a> </span><em>SIAM J. Applied Dynamical Systems</em> <em>10(4):1443-1479</em> (<em>2011</em>)Choose-your-own-adventure routing: Lightweight load-time defect avoidance.http://www.bibsonomy.org/bibtex/26376c94b25b05ebc29466d6f520e63b3/dblpdblp2012-02-08T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Rubin">Raphael Rubin</a>, and <a href="/author/DeHon">André DeHon</a> </span><em>TRETS</em> <em>4(4):33</em> (<em>2011</em>)A Methodology for Designing Optimal Self-Checking Sequential Circuits.http://www.bibsonomy.org/bibtex/2282836f5d04c4a5455746a084a621ede/dblpdblp2012-02-08T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Parekhji">Rubin A. Parekhji</a>, <a href="/author/Venkatesh">G. Venkatesh</a>, and <a href="/author/Sherlekar">Sunil D. Sherlekar</a> </span><em>ITC, </em><em>page 283-291. </em><em>IEEE Computer Society, </em>(<em>1991</em>)Panel Synopsis - How InAdequate is One Time Testing?http://www.bibsonomy.org/bibtex/2967fe1874a68c03a6628c0655bc65719/dblpdblp2012-02-08T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Parekhji">Rubin A. Parekhji</a> </span><em>ITC, </em><em>page 1279. </em><em>IEEE Computer Society, </em>(<em>2003</em>)A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx.http://www.bibsonomy.org/bibtex/2622f465832aba2447711b33ff337af16/dblpdblp2012-02-08T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Abraham">Jais Abraham</a>, <a href="/author/Prasad">Narayan Prasad</a>, <a href="/author/S.">Srinivasa Chakravarthy B. S.</a>, <a href="/author/Bagwe">Ameet Bagwe</a>, and <a href="/author/Parekhji">Rubin A. Parekhji</a> </span><em>ITC, </em><em>page 417-425. </em><em>IEEE Computer Society, </em>(<em>2000</em>)Design Techniques with Multiple Scan Compression CoDecs for Low Power and High Quality Scan Test.http://www.bibsonomy.org/bibtex/299ad7da551b95bbd7f1ced59fa839082/dblpdblp2012-02-07T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Jain">Arvind Jain</a>, <a href="/author/Subramanian">Sundarrajan Subramanian</a>, <a href="/author/Parekhji">Rubin A. Parekhji</a>, and <a href="/author/Ravi">Srivaths Ravi</a> </span><em>J. Low Power Electronics</em> <em>7(4):502-515</em> (<em>2011</em>)General Systems and Systems Engineering.http://www.bibsonomy.org/bibtex/2fd2cba786de8e816e1b708cd7afe4492/dblpdblp2012-02-07T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Rubin">Milton D. Rubin</a> </span><em>IEEE Trans. Systems Science and Cybernetics</em> <em>2(1):3-7</em> (<em>1966</em>)On-chip Test and Repair of Memories for Static and Dynamic Faults.http://www.bibsonomy.org/bibtex/270598aae8998b0923abc339e59b2a827/dblpdblp2012-02-07T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Thakur">Sanjay K. Thakur</a>, <a href="/author/Parekhji">Rubin A. Parekhji</a>, and <a href="/author/Chandorkar">Arun N. Chandorkar</a> </span><em>ITC, </em><em>page 1-10. </em><em>IEEE, </em>(<em>2006</em>)DFT Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs.http://www.bibsonomy.org/bibtex/2ca64378a7ebf7378f2aa816b53b7e76d/dblpdblp2012-02-07T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Dutta">Amit Dutta</a>, <a href="/author/Alampally">Srinivasulu Alampally</a>, <a href="/author/Prasanth">V. Prasanth</a>, and <a href="/author/Parekhji">Rubin A. Parekhji</a> </span><em>ITC, </em><em>page 1-10. </em><em>IEEE, </em>(<em>2008</em>)Artificially intelligent conversational agents in libraries.http://www.bibsonomy.org/bibtex/2dc0c056857534247fbb66cb01d03597c/dblpdblp2012-02-06T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Rubin">Victoria L. Rubin</a>, <a href="/author/Chen">Yimin Chen</a>, and <a href="/author/Thorimbert">Lynne Marie Thorimbert</a> </span><em>Library Hi Tech</em> <em>28(4):496-522</em> (<em>2010</em>)Successful Performance via Decision Generalisation in No Limit Texas Hold'em.http://www.bibsonomy.org/bibtex/2714edfe157f36135965bb4a04e766267/dblpdblp2012-02-06T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Rubin">Jonathan Rubin</a>, and <a href="/author/Watson">Ian Watson</a> </span><em>ICCBR, </em><em>volume 6880 of Lecture Notes in Computer Science, </em><em>page 467-481. </em><em>Springer, </em>(<em>2011</em>)An efficient test data reduction technique through dynamic pattern mixing across multiple fault models.http://www.bibsonomy.org/bibtex/256bd2a9d30eae4101e019404fce67c11/dblpdblp2012-02-06T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Alampally">Srinivasulu Alampally</a>, <a href="/author/Venkatesh">R. T. Venkatesh</a>, <a href="/author/Shanmugasundaram">P. Shanmugasundaram</a>, <a href="/author/Parekhji">Rubin A. Parekhji</a>, and <a href="/author/Agrawal">V. D. Agrawal</a> </span><em>VTS, </em><em>page 285-290. </em><em>IEEE Computer Society, </em>(<em>2011</em>)DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management.http://www.bibsonomy.org/bibtex/2a43006456d2d2eae12a50274a971e98a/dblpdblp2012-02-03T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Mittal">Rajesh Mittal</a>, <a href="/author/Balasubramanian">Lakshmanan Balasubramanian</a>, <a href="/author/Sontakke">Adesh Sontakke</a>, <a href="/author/Parthasarathy">Harikrishna Parthasarathy</a>, <a href="/author/Narayanan">Prakash Narayanan</a>, <a href="/author/Sabbarwal">Puneet Sabbarwal</a>, and <a href="/author/Parekhji">Rubin A. Parekhji</a> </span><em>ITC, </em><em>page 1-10. </em><em>IEEE, </em>(<em>2011</em>)Test time reduction using parallel RF test techniques.http://www.bibsonomy.org/bibtex/2c49cfcb8ed32d26dd42f65bf3128060f/dblpdblp2012-02-02T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Mittal">Rajesh Mittal</a>, <a href="/author/Sontakke">Adesh Sontakke</a>, and <a href="/author/Parekhji">Rubin A. Parekhji</a> </span><em>VTS, </em><em>page 40. </em><em>IEEE Computer Society, </em>(<em>2010</em>)Second international workshop on product line approaches in software engineering: PLEASE 2011.http://www.bibsonomy.org/bibtex/23da49b56791f20af462f1cf264488d70/dblpdblp2012-01-28T00:00:00+01:00dblp <span class="authorEditorList"><a href="/author/Rubin">Julia Rubin</a>, <a href="/author/Botterweck">Goetz Botterweck</a>, <a href="/author/Pleuss">Andreas Pleuss</a>, and <a href="/author/Weiss">David M. Weiss</a> </span><em>ICSE, </em><em>page 1204-1205. </em><em>ACM, </em>(<em>2011</em>)