BibSonomy publications for /author/Sudhakar Reddy

CBIR using Texels of colour Fuzzy Textons.

dblp — 2013-01-30T00:00:00+01:00

Sudhakar Putheti, Edara Srinivasa Reddy, and Sai Alekya Edara. HIS, page 461-467. IEEE, (2012)

A test pattern ordering algorithm for diagnosis with truncated fail data.

dblp — 2013-01-30T00:00:00+01:00

Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, and Janusz Rajski. DAC, page 399-404. ACM, (2006)

New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic.

dblp — 2013-01-30T00:00:00+01:00

Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, and Janusz Rajski. VLSI Design, page 419-424. IEEE Computer Society, (2006)

N-distinguishing Tests for Enhanced Defect Diagnosis.

dblp — 2013-01-30T00:00:00+01:00

Gang Chen 0011, Janusz Rajski, Sudhakar M. Reddy, and Irith Pomeranz. Asian Test Symposium, page 183-186. IEEE Computer Society, (2009)

Defect Aware Test Patterns.

dblp — 2013-01-30T00:00:00+01:00

Huaxing Tang, Gang Chen 0011, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, and Irith Pomeranz. DATE, page 450-455. IEEE Computer Society, (2005)

Procedures for Identifying Untestable and Redundant Transition Faults in Synchronous Sequential Circuits.

dblp — 2013-01-30T00:00:00+01:00

Gang Chen 0011, Sudhakar M. Reddy, and Irith Pomeranz. ICCD, page 36-41. IEEE Computer Society, (2003)

Functional test of small-delay faults using SAT and Craig interpolation.

dblp — 2013-01-10T00:00:00+01:00

Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, and Bernd Becker. ITC, page 1-8. IEEE Computer Society, (2012)

Improved volume diagnosis throughput using dynamic design partitioning.

dblp — 2013-01-10T00:00:00+01:00

Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, and Brady Benware. ITC, page 1-10. IEEE Computer Society, (2012)

Session Summary III: Power-Aware Testing: Present and Future.

dblp — 2013-01-07T00:00:00+01:00

Xiaoqing Wen, and Sudhakar M. Reddy. ATS, page 220. IEEE Computer Society, (2012)

Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns.

dblp — 2013-01-07T00:00:00+01:00

Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, and Sudhakar M. Reddy. ATS, page 7-12. IEEE Computer Society, (2012)

Estimating the relative single stuck-at fault coverage of test sets for a combinational logic block from its functional description.

dblp — 2012-11-27T00:00:00+01:00

Irith Pomeranz, and Sudhakar M. Reddy. HLDVT, page 31-35. IEEE Computer Society, (2001)

On compacting test sets by addition and removal of test vectors.

dblp — 2012-11-14T00:00:00+01:00

Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, and Sudhakar M. Reddy. VTS, page 202-207. IEEE Computer Society, (1994)

On identifying undetectable and redundant faults in synchronous sequential circuits.

dblp — 2012-11-14T00:00:00+01:00

Irith Pomeranz, and Sudhakar M. Reddy. VTS, page 8-14. IEEE Computer Society, (1994)

On the Detectability of Scan Chain Internal Faults - An Industrial Case Study.

dblp — 2012-11-10T00:00:00+01:00

Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, and Irith Pomeranz. VTS, page 79-84. IEEE Computer Society, (2008)

A Data Compression Technique for Built-In Self-Test.

dblp — 2012-10-25T00:00:00+02:00

Sudhakar M. Reddy, Kewal K. Saluja, and Mark G. Karpovsky. IEEE Trans. Computers 37(9):1151-1156 (1988)Correction: IEEE Transactions on Computers 382: 320 1989.

Vertex Splitting in Dags and Applications to Partial Scan Designs and Lossy Circuits.

dblp — 2012-09-14T00:00:00+02:00

Doowon Paik, Sudhakar M. Reddy, and Sartaj Sahni. Int. J. Found. Comput. Sci. 9(4):377-398 (1998)

A Hierarchical Environment for Interactive Test Engineering.

dblp — 2012-05-22T00:00:00+02:00

Thomas Burch, Joachim Hartmann, Günter Hotz, M. Krallmann, U. Nikolaus, Sudhakar M. Reddy, and Uwe Sparmann. ITC, page 461-470. IEEE Computer Society, (1994)

Design and Analysis of Fault-Tolerant Multistage Interconnection Networks With Low Link Complexity.

dblp — 2012-05-16T00:00:00+02:00

Vijay P. Kumar, and Sudhakar M. Reddy. ISCA, page 376-386. IEEE Computer Society, (1985)

Distributed Fault-Tolerance For Large Multiprocessor Systems.

dblp — 2012-05-16T00:00:00+02:00

Jon G. Kuhl, and Sudhakar M. Reddy. ISCA, page 23-30. ACM, (1980)

Learning abstract models for system design.

dblp — 2012-04-29T00:00:00+02:00

Sudhakar Y. Reddy. AI EDAM 10(2):167-169 (1996)