Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector. SEM EDS analysis or SEM EDX analysis can be used to provide chemical analysis in areas as small as one micrometer in diameter.Visit http://www.rockymountainlabs.com/scanning-electron-microscopy-sem.htm for more information.
conexp-ng - ConExp-NG is a simple GUI-centric tool for the study & research of Formal Concept Analysis (FCA) that allows you to create formal contexts, draw concept lattices and explore dependencies between attributes. ·