@article{weibrich2022radiation,
  abstract = {The study of semiconductor devices and their packages in relation to the interaction with ionizing radiation is becoming more and more important. The growing demands on components in shrinking structures are making influences increasingly likely. This paper is intended to give a brief overview of the possibility of combining
measurement and simulation of the effects of single-event upsets (SEUs) in SRAM and flip-flop memory cells. A test chip based on the XFAB XT018 180nm high temperature SOI CMOS technology is designed to experimentally analyze the impact of radiation on flip-flops and SRAM cells. The hardware architecture of the chip enables spatial and temporal self-detection and reporting of bit flip errors in
memory arrays. Control and communication parts of the chip are protected against radiation in order to reliably identify and characterize memory errors. Pre-silicon evaluation results of a fault injection campaign in gate-level simulations show fully accurate bit flip detection for soft error rates (SER) up to 0.6%. For an expected SER <2.5%, very good error self-detection rates of more than 99.7% are
achieved. The proposed chip design is currently manufactured and will be used in radiation experiments for characterization when available.},
  added-at = {2023-03-15T17:17:53.000+0100},
  author = {Weißbrich, Moritz and Payá-Vayá, Guillermo and Ewert, Christian and Weide-Zaage, Kirsten and Schmidt, Katarina and Hagenah, Dorian},
  biburl = {https://www.bibsonomy.org/bibtex/2454cd87bc7daa8ece873942e5fd929e8/eisl3s},
  interhash = {6ed29c2db2f571f1ac5c818963f4a581},
  intrahash = {454cd87bc7daa8ece873942e5fd929e8},
  journal = {Pan Pacific Symposium 2022},
  keywords = {myown},
  timestamp = {2023-03-15T17:17:53.000+0100},
  title = {SRAM Test Chip for Radiation Experiment},
  url = {https://smta.org/page/knowledge-search#conference-proceedings/proceedings-by-year/5e46de4c222bfe08592ecfd5/view-publication-details5/628ea77fe2b750001e315cc6/entry-details4/62b3943f8630c0071962e1a3/},
  year = 2022
}