%0 Journal Article %1 journals/dt/YanHNCNHGW23 %A Yan, Aibin %A He, Yuting %A Niu, Xiaoxiao %A Cui, Jie %A Ni, Tianming %A Huang, Zhengfeng %A Girard, Patrick %A Wen, Xiaoqing %D 2023 %J IEEE Des. Test %K dblp %N 4 %P 34-41 %T A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. %U http://dblp.uni-trier.de/db/journals/dt/dt40.html#YanHNCNHGW23 %V 40

@article{journals/dt/YanHNCNHGW23, added-at = {2023-07-07T00:00:00.000+0200}, author = {Yan, Aibin and He, Yuting and Niu, Xiaoxiao and Cui, Jie and Ni, Tianming and Huang, Zhengfeng and Girard, Patrick and Wen, Xiaoqing}, biburl = {https://www.bibsonomy.org/bibtex/29c6fdcb32fc1669359694669f69858ca/dblp}, ee = {https://doi.org/10.1109/MDAT.2023.3267747}, interhash = {0f82530150b129f1edbc61e2b141f58b}, intrahash = {9c6fdcb32fc1669359694669f69858ca}, journal = {IEEE Des. Test}, keywords = {dblp}, month = {August}, number = 4, pages = {34-41}, timestamp = {2024-04-09T04:13:01.000+0200}, title = {A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt40.html#YanHNCNHGW23}, volume = 40, year = 2023 }