%0 Journal Article %1 journals/mr/SongJKKPKKLK05 %A Song, Yoon-Jong %A Joo, Heung-Jin %A Kang, Seung-Kuk %A Kim, Hyun-Ho %A Park, Jung-Hoon %A Kang, Y. M. %A Kang, E. Y. %A Lee, Sung-Young %A Kim, Kinam %D 2005 %J Microelectron. Reliab. %K dblp %N 7-8 %P 1150-1153 %T Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#SongJKKPKKLK05 %V 45

@article{journals/mr/SongJKKPKKLK05, added-at = {2021-10-01T00:00:00.000+0200}, author = {Song, Yoon-Jong and Joo, Heung-Jin and Kang, Seung-Kuk and Kim, Hyun-Ho and Park, Jung-Hoon and Kang, Y. M. and Kang, E. Y. and Lee, Sung-Young and Kim, Kinam}, biburl = {https://www.bibsonomy.org/bibtex/22380f11bc99ee47008604c1b26c60a05/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.08.014}, interhash = {2c194be6f7a28a28244330557908342c}, intrahash = {2380f11bc99ee47008604c1b26c60a05}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {7-8}, pages = {1150-1153}, timestamp = {2024-04-09T02:49:28.000+0200}, title = {Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#SongJKKPKKLK05}, volume = 45, year = 2005 }