%0 Conference Paper %1 conf/itc/TamB11 %A Tam, Wing Chiu %A Blanton, R. D. (Shawn) %B ITC %D 2011 %E Eklow, Bill %E Blanton, R. D. (Shawn) %I IEEE Computer Society %K dblp %P 1-10 %T Physically-aware analysis of systematic defects in integrated circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc2011.html#TamB11 %@ 978-1-4577-0153-5

@inproceedings{conf/itc/TamB11, added-at = {2023-03-23T00:00:00.000+0100}, author = {Tam, Wing Chiu and Blanton, R. D. (Shawn)}, biburl = {https://www.bibsonomy.org/bibtex/264185c7c93d7670902562923c38605a1/dblp}, booktitle = {ITC}, crossref = {conf/itc/2011}, editor = {Eklow, Bill and Blanton, R. D. (Shawn)}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2011.6139137}, interhash = {507eae29c935bfbce60ec8c5052e5f70}, intrahash = {64185c7c93d7670902562923c38605a1}, isbn = {978-1-4577-0153-5}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:30:01.000+0200}, title = {Physically-aware analysis of systematic defects in integrated circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2011.html#TamB11}, year = 2011 }