%0 Conference Paper %1 conf/iscas/HashizumeIYT05 %A Hashizume, Masaki %A Ichimiya, Masahiro %A Yotsuyanagi, Hiroyuki %A Tamesada, Takeomi %B ISCAS (3) %D 2005 %I IEEE %K dblp %P 2995-2998 %T Electric field for detecting open leads in CMOS logic circuits by supply current testing. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2005-3.html#HashizumeIYT05 %@ 0-7803-8834-8

@inproceedings{conf/iscas/HashizumeIYT05, added-at = {2007-12-03T00:00:00.000+0100}, author = {Hashizume, Masaki and Ichimiya, Masahiro and Yotsuyanagi, Hiroyuki and Tamesada, Takeomi}, biburl = {https://www.bibsonomy.org/bibtex/22eb7e4bc6d6a7a08b3aa913540d710b5/dblp}, booktitle = {ISCAS (3)}, crossref = {conf/iscas/2005}, ee = {http://dx.doi.org/10.1109/ISCAS.2005.1465257}, interhash = {16b3e7dbd02cc93f0b17528eaec2b051}, intrahash = {2eb7e4bc6d6a7a08b3aa913540d710b5}, isbn = {0-7803-8834-8}, keywords = {dblp}, pages = {2995-2998}, publisher = {IEEE}, timestamp = {2016-05-21T12:01:14.000+0200}, title = {Electric field for detecting open leads in CMOS logic circuits by supply current testing.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2005-3.html#HashizumeIYT05}, year = 2005 }