%0 Conference Paper %1 conf/irps/SeifertJVP15 %A Seifert, Norbert %A Jahinuzzaman, Shah M. %A Velamala, Jyothi %A Patel, Nikunj %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#SeifertJVP15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/SeifertJVP15, added-at = {2017-05-21T00:00:00.000+0200}, author = {Seifert, Norbert and Jahinuzzaman, Shah M. and Velamala, Jyothi and Patel, Nikunj}, biburl = {https://www.bibsonomy.org/bibtex/2cc70875de976fe4e70ffa3700746e64f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112676}, interhash = {7cefd020fd678ae91626c55aaba93b12}, intrahash = {cc70875de976fe4e70ffa3700746e64f}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2019-10-17T14:45:48.000+0200}, title = {Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#SeifertJVP15}, year = 2015 }