%0 Journal Article %1 Testa2010 %A Testa, A. %A Caro, A. De %A Panarello, S. %A Patane, A. %A Russo, S. %A Patti, D. %A Poma, S. %A Letor, R. %D 2010 %J Microelectronics Reliability %K imported %N 9-11 %P 1789--1795 %T Reliability of planar, Super-Junction and trench low voltage power MOSFETs %V 50

@article{Testa2010, added-at = {2013-01-07T16:10:56.000+0100}, author = {Testa, A. and Caro, A. De and Panarello, S. and Patane, A. and Russo, S. and Patti, D. and Poma, S. and Letor, R.}, biburl = {https://www.bibsonomy.org/bibtex/285d4aa4fce09088df0aa4b46214f71c7/olivia.bluder}, interhash = {1a936b93b18f4cbd23a86f1bf6d5df99}, intrahash = {85d4aa4fce09088df0aa4b46214f71c7}, journal = {Microelectronics Reliability}, keywords = {imported}, number = {9-11}, owner = {bluder}, pages = {1789--1795}, timestamp = {2013-01-07T16:11:07.000+0100}, title = {Reliability of planar, Super-Junction and trench low voltage power {MOSFET}s}, volume = 50, year = 2010 }