%0 Journal Article %1 WOS:A1996UF56800011 %A Silva, MAA %A Ribeiro, E %A Schulz, PA %A Cerdeira, F %A Bean, JC %C BAFFINS LANE CHICHESTER, W SUSSEX, ENGLAND PO19 1UD %D 1996 %I JOHN WILEY & SONS LTD %J JOURNAL OF RAMAN SPECTROSCOPY %K imported %N 3-4 %P 257-263 %T Characterization of different length scales and periodicities in Ge/Si microstructures by Raman spectroscopy: Theory and experiment %V 27 %X The Raman spectra of samples of the type (GenSim)(N-1) Ge-n Si-M x p with n approximate to m approximate to 5 monolayers, M approximate to 200 monolayers and p approximate to 10-20 were measured in the backscattering configuration in the wavenumber range 2-600 cm(-1). The experimental results are discussed by comparison with simulated spectra calculated with a linear chain model with bond polarizabilities for the Raman intensities, Comparison between experimental and theoretical spectra gives insights into the sensitivity of the different Raman peaks as a probe of periodicity and interface roughness length scales.

@article{WOS:A1996UF56800011, abstract = {The Raman spectra of samples of the type [(GenSim)(N-1) Ge-n Si-M] x p with n approximate to m approximate to 5 monolayers, M approximate to 200 monolayers and p approximate to 10-20 were measured in the backscattering configuration in the wavenumber range 2-600 cm(-1). The experimental results are discussed by comparison with simulated spectra calculated with a linear chain model with bond polarizabilities for the Raman intensities, Comparison between experimental and theoretical spectra gives insights into the sensitivity of the different Raman peaks as a probe of periodicity and interface roughness length scales.}, added-at = {2022-05-23T20:00:14.000+0200}, address = {BAFFINS LANE CHICHESTER, W SUSSEX, ENGLAND PO19 1UD}, author = {Silva, MAA and Ribeiro, E and Schulz, PA and Cerdeira, F and Bean, JC}, biburl = {https://www.bibsonomy.org/bibtex/2b1b2dace0958bca40aaf783fe5e34800/ppgfis_ufc_br}, interhash = {f49e075ce4c7fd9a85fa9511d85e7f0c}, intrahash = {b1b2dace0958bca40aaf783fe5e34800}, issn = {0377-0486}, journal = {JOURNAL OF RAMAN SPECTROSCOPY}, keywords = {imported}, number = {3-4}, pages = {257-263}, publisher = {JOHN WILEY & SONS LTD}, pubstate = {published}, timestamp = {2022-05-23T20:00:14.000+0200}, title = {Characterization of different length scales and periodicities in Ge/Si microstructures by Raman spectroscopy: Theory and experiment}, tppubtype = {article}, volume = 27, year = 1996 }