%0 Journal Article %1 journals/tie/RonankiW20 %A Ronanki, Deepak %A Williamson, Sheldon S. %D 2020 %J IEEE Trans. Ind. Electron. %K dblp %N 4 %P 2585-2594 %T Failure Prediction of Submodule Capacitors in Modular Multilevel Converter by Monitoring the Intrinsic Capacitor Voltage Fluctuations. %U http://dblp.uni-trier.de/db/journals/tie/tie67.html#RonankiW20 %V 67

@article{journals/tie/RonankiW20, added-at = {2020-05-22T00:00:00.000+0200}, author = {Ronanki, Deepak and Williamson, Sheldon S.}, biburl = {https://www.bibsonomy.org/bibtex/22b2053639c03bf85a44fa66b7e7610d7/dblp}, ee = {https://doi.org/10.1109/TIE.2019.2912771}, interhash = {f738f20bc78c7c2dffff7664d416b4c2}, intrahash = {2b2053639c03bf85a44fa66b7e7610d7}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 4, pages = {2585-2594}, timestamp = {2020-05-23T11:52:11.000+0200}, title = {Failure Prediction of Submodule Capacitors in Modular Multilevel Converter by Monitoring the Intrinsic Capacitor Voltage Fluctuations.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie67.html#RonankiW20}, volume = 67, year = 2020 }