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%0 Conference Paper
%1 conf/ets/FonsecaDBGPVB10a
%A Fonseca, Renan Alves
%A Dilillo, Luigi
%A Bosio, Alberto
%A Girard, Patrick
%A Pravossoudovitch, Serge
%A Virazel, Arnaud
%A Badereddine, Nabil
%B European Test Symposium
%D 2010
%I IEEE Computer Society
%K dblp
%P 257
%T Setting test conditions for improving SRAM reliability.
%U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#FonsecaDBGPVB10a
%@ 978-1-4244-5833-2
@inproceedings{conf/ets/FonsecaDBGPVB10a,
added-at = {2017-05-22T00:00:00.000+0200},
author = {Fonseca, Renan Alves and Dilillo, Luigi and Bosio, Alberto and Girard, Patrick and Pravossoudovitch, Serge and Virazel, Arnaud and Badereddine, Nabil},
biburl = {https://www.bibsonomy.org/bibtex/2597b92a6c3d629057a2dddf239d6680b/dblp},
booktitle = {European Test Symposium},
crossref = {conf/ets/2010},
ee = {https://doi.org/10.1109/ETSYM.2010.5512734},
interhash = {fd2dcdec9f50f4dfee832a601baf84b6},
intrahash = {597b92a6c3d629057a2dddf239d6680b},
isbn = {978-1-4244-5833-2},
keywords = {dblp},
pages = 257,
publisher = {IEEE Computer Society},
timestamp = {2019-10-17T15:59:35.000+0200},
title = {Setting test conditions for improving SRAM reliability.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#FonsecaDBGPVB10a},
year = 2010
}