%0 Journal Article %1 journals/tim/KimKN17 %A Kim, Gyu-Yeol %A Kang, Shin-Ho %A Nah, Wansoo %D 2017 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 10 %P 2638-2646 %T Novel TDR Test Method for Diagnosis of Interconnect Failures Using Automatic Test Equipment. %U http://dblp.uni-trier.de/db/journals/tim/tim66.html#KimKN17 %V 66

@article{journals/tim/KimKN17, added-at = {2017-09-21T00:00:00.000+0200}, author = {Kim, Gyu-Yeol and Kang, Shin-Ho and Nah, Wansoo}, biburl = {https://www.bibsonomy.org/bibtex/2091229a3c3435c9930b0f44f2c96623a/dblp}, ee = {https://doi.org/10.1109/TIM.2017.2712978}, interhash = {552683b3a4c7d4c50c54eceb8b199f84}, intrahash = {091229a3c3435c9930b0f44f2c96623a}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 10, pages = {2638-2646}, timestamp = {2017-12-07T22:16:50.000+0100}, title = {Novel TDR Test Method for Diagnosis of Interconnect Failures Using Automatic Test Equipment.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim66.html#KimKN17}, volume = 66, year = 2017 }