%0 Journal Article %1 LECU2010 %A Lecuyer, P. %A Fremont, H. %A Landesman, J-P. %A Bahi, M-A. %D 2010 %J Microelectronics Reliability %K imported %P 1744-1749 %T Wearout estimation using the robustness validation methodology for components in 150 $^\circ$C ambient automotive applications %V 50

@article{LECU2010, added-at = {2013-01-07T16:10:56.000+0100}, author = {Lecuyer, P. and Fremont, H. and Landesman, J-P. and Bahi, M-A.}, biburl = {https://www.bibsonomy.org/bibtex/22dd23ff73a82826011ed05818951dee3/olivia.bluder}, interhash = {d684d05b26766bae5d38d43a5cb2ee4e}, intrahash = {2dd23ff73a82826011ed05818951dee3}, journal = {Microelectronics Reliability}, keywords = {imported}, owner = {bluder}, pages = {1744-1749}, timestamp = {2013-01-07T16:10:58.000+0100}, title = {Wearout estimation using the robustness validation methodology for components in 150 $^{\circ}$C ambient automotive applications}, volume = 50, year = 2010 }