%0 Conference Paper %1 conf/ats/LiuLW16 %A Liu, Hsuan-Wei %A Lin, Bing-Yang %A Wu, Cheng-Wen %B ATS %D 2016 %I IEEE Computer Society %K dblp %P 156-160 %T Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test. %U http://dblp.uni-trier.de/db/conf/ats/ats2016.html#LiuLW16 %@ 978-1-5090-3809-1

@inproceedings{conf/ats/LiuLW16, added-at = {2023-09-30T00:00:00.000+0200}, author = {Liu, Hsuan-Wei and Lin, Bing-Yang and Wu, Cheng-Wen}, biburl = {https://www.bibsonomy.org/bibtex/23d1560a9f6ac7cb3aa6fe4a7d371e1c8/dblp}, booktitle = {ATS}, crossref = {conf/ats/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2016.25}, interhash = {108269ea57d54486456fe30cf1343c96}, intrahash = {3d1560a9f6ac7cb3aa6fe4a7d371e1c8}, isbn = {978-1-5090-3809-1}, keywords = {dblp}, pages = {156-160}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:46.000+0200}, title = {Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2016.html#LiuLW16}, year = 2016 }