%0 Conference Paper %1 conf/ets/LinRR16 %A Lin, Xijiang %A Reddy, Sudhakar M. %A Rajski, Janusz %B ETS %D 2016 %I IEEE %K dblp %P 1-6 %T Transistor stuck-on fault detection tests for digital CMOS circuits. %U http://dblp.uni-trier.de/db/conf/ets/ets2016.html#LinRR16 %@ 978-1-4673-9659-2

@inproceedings{conf/ets/LinRR16, added-at = {2017-05-22T00:00:00.000+0200}, author = {Lin, Xijiang and Reddy, Sudhakar M. and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/2a9efa605b8a467e2cc86c99b56ffa5b5/dblp}, booktitle = {ETS}, crossref = {conf/ets/2016}, ee = {https://doi.org/10.1109/ETS.2016.7519329}, interhash = {240cf3d6559bc27efff195898eb7da2f}, intrahash = {a9efa605b8a467e2cc86c99b56ffa5b5}, isbn = {978-1-4673-9659-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {Transistor stuck-on fault detection tests for digital CMOS circuits.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2016.html#LinRR16}, year = 2016 }