%0 Journal Article %1 CIAP2002 %A Ciappa, M. %A Carbognani, F. %A Cova, P. %A Fichtner, W. %D 2002 %J Microelectronics Reliability %K imported %N 9-11 %P 1653--1658 %T A Novel Thermomechanics-Based Lifetime Prediction model for cycle Fatigue Failure Mechanisms in Power Semiconductors %V 42

@article{CIAP2002, added-at = {2013-01-07T16:10:56.000+0100}, author = {Ciappa, M. and Carbognani, F. and Cova, P. and Fichtner, W.}, biburl = {https://www.bibsonomy.org/bibtex/25a2ee8c2dd801f2e19f77c1d869ce931/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Bluder\\Literatur\\Semiconductor_lifetime_prediction\\CIAPPA_et_al_A Novel Thermomechanics-Based Lifetime Prediction model for cycle Fatigue Failure Mechanisms in Power Semiconductors.pdf:PDF}, interhash = {fe3fc49496978572b37d6d7a63e51604}, intrahash = {5a2ee8c2dd801f2e19f77c1d869ce931}, journal = {Microelectronics Reliability}, keywords = {imported}, number = {9-11}, owner = {bluder}, pages = {1653--1658}, timestamp = {2013-01-07T16:11:13.000+0100}, title = {A Novel Thermomechanics-Based Lifetime Prediction model for cycle Fatigue Failure Mechanisms in Power Semiconductors}, volume = 42, year = 2002 }