%0 Conference Paper %1 conf/itc/VenkataramanPBA17 %A Venkataraman, Srikanth %A Pomeranz, Irith %A Bodhe, Shraddha %A Amyeen, M. Enamul %B ITC %D 2017 %I IEEE %K dblp %P 1-9 %T Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. %U http://dblp.uni-trier.de/db/conf/itc/itc2017.html#VenkataramanPBA17 %@ 978-1-5386-3413-4

@inproceedings{conf/itc/VenkataramanPBA17, added-at = {2018-01-05T00:00:00.000+0100}, author = {Venkataraman, Srikanth and Pomeranz, Irith and Bodhe, Shraddha and Amyeen, M. Enamul}, biburl = {https://www.bibsonomy.org/bibtex/25deae48aee3e689468346b4df9c1e6fb/dblp}, booktitle = {ITC}, crossref = {conf/itc/2017}, ee = {https://doi.org/10.1109/TEST.2017.8242049}, interhash = {4178fbef2f66752d059d0cb1a407c86f}, intrahash = {5deae48aee3e689468346b4df9c1e6fb}, isbn = {978-1-5386-3413-4}, keywords = {dblp}, pages = {1-9}, publisher = {IEEE}, timestamp = {2018-01-06T11:34:48.000+0100}, title = {Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2017.html#VenkataramanPBA17}, year = 2017 }