%0 Journal Article %1 journals/tc/SukR81 %A Suk, Dong S. %A Reddy, Sudhakar M. %D 1981 %J IEEE Trans. Computers %K dblp %N 12 %P 982-985 %T A March Test for Functional Faults in Semiconductor Random Access Memories. %U http://dblp.uni-trier.de/db/journals/tc/tc30.html#SukR81 %V 30

@article{journals/tc/SukR81, added-at = {2015-12-22T00:00:00.000+0100}, author = {Suk, Dong S. and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/283ee99ecfb9f3a585e95f398fb86addd/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1981.1675739}, interhash = {6a1590a8750d43d01bf026311e2b252f}, intrahash = {83ee99ecfb9f3a585e95f398fb86addd}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 12, pages = {982-985}, timestamp = {2015-12-24T11:50:04.000+0100}, title = {A March Test for Functional Faults in Semiconductor Random Access Memories.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc30.html#SukR81}, volume = 30, year = 1981 }