%0 Conference Paper %1 conf/vlsid/ChatterjeeN97 %A Chatterjee, Abhijit %A Nagi, Naveena %B VLSI Design %D 1997 %I IEEE Computer Society %K dblp %P 388-392 %T Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1997.html#ChatterjeeN97 %@ 0-8186-7755-4

@inproceedings{conf/vlsid/ChatterjeeN97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chatterjee, Abhijit and Nagi, Naveena}, biburl = {https://www.bibsonomy.org/bibtex/29d7fcb842d81071bb2b495d219a0954f/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1997.568158}, interhash = {fbc68b7570573118fcd3c38120a914ee}, intrahash = {9d7fcb842d81071bb2b495d219a0954f}, isbn = {0-8186-7755-4}, keywords = {dblp}, pages = {388-392}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:47:27.000+0200}, title = {Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1997.html#ChatterjeeN97}, year = 1997 }