%0 Conference Paper %1 conf/isqed/LeeHMH09 %A Lee, Ju-Yueh %A Hu, Yu %A Majumdar, Rupak %A He, Lei %B ISQED %D 2009 %I IEEE Computer Society %K dblp %P 702-707 %T Simultaneous test pattern compaction, ordering and X-filling for testing power reduction. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#LeeHMH09 %@ 978-1-4244-2952-3

@inproceedings{conf/isqed/LeeHMH09, added-at = {2023-03-23T00:00:00.000+0100}, author = {Lee, Ju-Yueh and Hu, Yu and Majumdar, Rupak and He, Lei}, biburl = {https://www.bibsonomy.org/bibtex/2d22efb2a62557834e5f8d77b3131531c/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2009.4810379}, interhash = {d845f8dedcc880aea7a6750e7c487ee3}, intrahash = {d22efb2a62557834e5f8d77b3131531c}, isbn = {978-1-4244-2952-3}, keywords = {dblp}, pages = {702-707}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:09:30.000+0200}, title = {Simultaneous test pattern compaction, ordering and X-filling for testing power reduction.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#LeeHMH09}, year = 2009 }