%0 Conference Paper %1 conf/dac/ParkM90 %A Park, Eun Sei %A Mercer, M. Ray %B DAC %D 1990 %E Smith, Richard C. %I IEEE Computer Society Press %K dblp %P 522-528 %T An Efficient Delay Test Generation System for Combinational Logic Circuits. %U http://dblp.uni-trier.de/db/conf/dac/dac90.html#ParkM90 %@ 0-89791-363-9

@inproceedings{conf/dac/ParkM90, added-at = {2017-03-16T00:00:00.000+0100}, author = {Park, Eun Sei and Mercer, M. Ray}, biburl = {https://www.bibsonomy.org/bibtex/2e9a2ee8c127bbc98659daa1d4c553a8a/dblp}, booktitle = {DAC}, crossref = {conf/dac/1990}, editor = {Smith, Richard C.}, ee = {http://doi.acm.org/10.1145/123186.123390}, interhash = {1788ae77988db026bfac3240cb8595c6}, intrahash = {e9a2ee8c127bbc98659daa1d4c553a8a}, isbn = {0-89791-363-9}, keywords = {dblp}, pages = {522-528}, publisher = {IEEE Computer Society Press}, timestamp = {2017-03-17T11:40:39.000+0100}, title = {An Efficient Delay Test Generation System for Combinational Logic Circuits.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac90.html#ParkM90}, year = 1990 }