%0 Journal Article %1 1367-2630-12-3-035018 %A Vaxelaire, N %A Proudhon, H %A Labat, S %A Kirchlechner, C %A Keckes, J %A Jacques, V %A Ravy, S %A Forest, S %A Thomas, O %D 2010 %J New Journal of Physics %K diffraction myown polycrystalline x-ray %N 3 %P 035018 %T Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction %U http://stacks.iop.org/1367-2630/12/i=3/a=035018 %V 12 %X Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.

@article{1367-2630-12-3-035018, abstract = {Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.}, added-at = {2011-02-18T19:09:50.000+0100}, author = {Vaxelaire, N and Proudhon, H and Labat, S and Kirchlechner, C and Keckes, J and Jacques, V and Ravy, S and Forest, S and Thomas, O}, biburl = {https://www.bibsonomy.org/bibtex/2f2e95d1b843bb8f2a4a9964831971421/heprom}, description = {Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction}, interhash = {1bdfa1e84b0175f1d379eb2dba1b82fc}, intrahash = {f2e95d1b843bb8f2a4a9964831971421}, journal = {New Journal of Physics}, keywords = {diffraction myown polycrystalline x-ray}, number = 3, pages = 035018, timestamp = {2011-02-18T19:09:50.000+0100}, title = {Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction}, url = {http://stacks.iop.org/1367-2630/12/i=3/a=035018}, volume = 12, year = 2010 }