%0 Conference Paper %1 conf/itc/JohnsonNJCMD16 %A Johnson, Michael %A Noble, Brian %A Johnson, Mark %A Crafts, Jim %A Manya, Cynthia %A Deforge, John %B ITC %D 2016 %I IEEE %K dblp %P 1-8 %T Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. %U http://dblp.uni-trier.de/db/conf/itc/itc2016.html#JohnsonNJCMD16 %@ 978-1-4673-8773-6

@inproceedings{conf/itc/JohnsonNJCMD16, added-at = {2017-01-09T00:00:00.000+0100}, author = {Johnson, Michael and Noble, Brian and Johnson, Mark and Crafts, Jim and Manya, Cynthia and Deforge, John}, biburl = {https://www.bibsonomy.org/bibtex/2fed0d9afb194ae3ae906db8de8b958f3/dblp}, booktitle = {ITC}, crossref = {conf/itc/2016}, ee = {http://dx.doi.org/10.1109/TEST.2016.7805871}, interhash = {4296fbbe0c19d04c898e94fd37575ca3}, intrahash = {fed0d9afb194ae3ae906db8de8b958f3}, isbn = {978-1-4673-8773-6}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2017-01-10T11:36:45.000+0100}, title = {Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2016.html#JohnsonNJCMD16}, year = 2016 }