%0 Journal Article %1 journals/jzusc/LiSXT16 %A Li, Xin %A Sun, Jin %A Xiao, Fu %A Tian, Jiangshan %D 2016 %J Frontiers Inf. Technol. Electron. Eng. %K dblp %N 2 %P 160-172 %T An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations. %U http://dblp.uni-trier.de/db/journals/jzusc/jzusc17.html#LiSXT16 %V 17

@article{journals/jzusc/LiSXT16, added-at = {2022-03-16T00:00:00.000+0100}, author = {Li, Xin and Sun, Jin and Xiao, Fu and Tian, Jiangshan}, biburl = {https://www.bibsonomy.org/bibtex/2410a8934a6d441a68a40309ec7a9095b/dblp}, ee = {https://doi.org/10.1631/FITEE.1500168}, interhash = {3011e64887ae4cfa76b1e07366f5039d}, intrahash = {410a8934a6d441a68a40309ec7a9095b}, journal = {Frontiers Inf. Technol. Electron. Eng.}, keywords = {dblp}, number = 2, pages = {160-172}, timestamp = {2024-04-08T12:33:23.000+0200}, title = {An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations.}, url = {http://dblp.uni-trier.de/db/journals/jzusc/jzusc17.html#LiSXT16}, volume = 17, year = 2016 }