%0 Journal Article %1 journals/mr/HelfmeierFG16 %A Helfmeier, Clemens %A Frieß, Erik %A Glück, Joachim %D 2016 %J Microelectron. Reliab. %K %P 306-309 %T Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#HelfmeierFG16 %V 64

@article{journals/mr/HelfmeierFG16, added-at = {2023-12-12T20:56:30.000+0100}, author = {Helfmeier, Clemens and Frieß, Erik and Glück, Joachim}, biburl = {https://www.bibsonomy.org/bibtex/25d05d6187790b0c360c093dc26df4085/admin}, ee = {https://doi.org/10.1016/j.microrel.2016.07.111}, interhash = {36b010f936e42bf78c880659efdedb85}, intrahash = {5d05d6187790b0c360c093dc26df4085}, journal = {Microelectron. Reliab.}, keywords = {}, pages = {306-309}, timestamp = {2023-12-12T20:56:30.000+0100}, title = {Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#HelfmeierFG16}, volume = 64, year = 2016 }