Misc,

The Neumann sieve problem and dimensional reduction: a multiscale approach

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(May 30, 2006)

Abstract

We perform a multiscale analysis for the elastic energy of a \$n\$-dimensional bilayer thin film of thickness \$2\delta\$ whose layers are connected through an \$\epsilon\$-periodically distributed contact zone. Describing the contact zone as a union of \$(n-1)\$-dimensional balls of radius \$r\epsilon\$ (the holes of the sieve) and assuming that \$\epsilon\$, we show that the asymptotic memory of the sieve (as \$0\$) is witnessed by the presence of an extra interfacial energy term. Moreover we find three different limit behaviors (or regimes) depending on the mutual vanishing rate of \$\delta\$ and \$r\$. We also give an explicit nonlinear capacitary-type formula for the interfacial energy density in each regime.

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