Abstract
We perform a multiscale analysis for the elastic energy of a \$n\$-dimensional
bilayer thin film of thickness \$2\delta\$ whose layers are connected through an
\$\epsilon\$-periodically distributed contact zone. Describing the contact zone
as a union of \$(n-1)\$-dimensional balls of radius \$r\epsilon\$ (the holes of
the sieve) and assuming that \$\epsilon\$, we show that the asymptotic
memory of the sieve (as \$0\$) is witnessed by the presence of an
extra interfacial energy term. Moreover we find three different limit behaviors
(or regimes) depending on the mutual vanishing rate of \$\delta\$ and \$r\$. We
also give an explicit nonlinear capacitary-type formula for the interfacial
energy density in each regime.
Users
Please
log in to take part in the discussion (add own reviews or comments).