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%0 Journal Article
%1 journals/tetc/BarenghiHBSRK14
%A Barenghi, Alessandro
%A Hocquet, Cédric
%A Bol, David
%A Standaert, François-Xavier
%A Regazzoni, Francesco
%A Koren, Israel
%D 2014
%J IEEE Trans. Emerg. Top. Comput.
%K dblp
%N 2
%P 107-118
%T A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks.
%U http://dblp.uni-trier.de/db/journals/tetc/tetc2.html#BarenghiHBSRK14
%V 2
@article{journals/tetc/BarenghiHBSRK14,
added-at = {2021-10-14T00:00:00.000+0200},
author = {Barenghi, Alessandro and Hocquet, Cédric and Bol, David and Standaert, François-Xavier and Regazzoni, Francesco and Koren, Israel},
biburl = {https://www.bibsonomy.org/bibtex/2690c63f117ba1c588dbeea6a68a25c5e/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/TETC.2014.2316509},
interhash = {511ef09511a4b733476de838fe7fa33c},
intrahash = {690c63f117ba1c588dbeea6a68a25c5e},
journal = {IEEE Trans. Emerg. Top. Comput.},
keywords = {dblp},
number = 2,
pages = {107-118},
timestamp = {2024-04-08T15:30:18.000+0200},
title = {A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks.},
url = {http://dblp.uni-trier.de/db/journals/tetc/tetc2.html#BarenghiHBSRK14},
volume = 2,
year = 2014
}