%0 Conference Paper %1 conf/itc/RonckenB96 %A Roncken, Marly %A Bruls, Eric %B ITC %D 1996 %I IEEE Computer Society %K dblp %P 205-214 %T Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. %U http://dblp.uni-trier.de/db/conf/itc/itc1996.html#RonckenB96 %@ 0-7803-3541-4

@inproceedings{conf/itc/RonckenB96, added-at = {2023-03-23T00:00:00.000+0100}, author = {Roncken, Marly and Bruls, Eric}, biburl = {https://www.bibsonomy.org/bibtex/2b7e61d639ee5cf4dba87f17d08af1147/dblp}, booktitle = {ITC}, crossref = {conf/itc/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1996.556963}, interhash = {65948a1d1bfde01fc8d2470e9cb45e7f}, intrahash = {b7e61d639ee5cf4dba87f17d08af1147}, isbn = {0-7803-3541-4}, keywords = {dblp}, pages = {205-214}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:20.000+0200}, title = {Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1996.html#RonckenB96}, year = 1996 }